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Title:
quantitatively managing defects for iterative projects: an industrial experience report in china
Author: Gou Lang ; Wang Qing ; Yuan Jun ; Yang Ye ; Li Mingshu ; Jiang Nan
Source: Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Conference Name: International Conference on Software Process
Conference Date: MAY 10-11,
Issued Date: 2008
Conference Place: Leipzig, GERMANY
Keyword: measurement ; quantitative process management ; defect management ; software process improvement
Publisher: MAKING GLOBALLY DISTRIBUTED SOFTWARE DEVELOPMENT A SUCCESS STORY
Publish Place: HEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY
ISSN: 0302-9743
ISBN: 978-3-540-79587-2
Department: Gou, Lang; Wang, Qing; Yang, Ye; Li, Mingshu; Jiang, Nan Chinese Acad Sci, Inst Software, Beijing 100864, Peoples R China.
Sponsorship: Int Software Proc Asso c, Inst Software, Chinese Acad Sci, ISCAS Lab Internet Software Technol
English Abstract: Iterative development methodology has been widely adopted in recent years since it is flexible and capable of dealing with requirement volatility. However, how to quantitatively manage iterative projects, and in particular, how to quantitative
Content Type: 会议论文
URI: http://ir.iscas.ac.cn/handle/311060/10602
Appears in Collections:互联网软件技术实验室 _会议论文

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Recommended Citation:
Gou Lang,Wang Qing,Yuan Jun,et al. quantitatively managing defects for iterative projects: an industrial experience report in china[C]. 见:International Conference on Software Process. Leipzig, GERMANY. MAY 10-11,.
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