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题名:
algorithms for analog vlsi 2d stack generation and block merging
作者: Liu R ; Dong SQ ; Hong XL ; Long D ; Gu J
会议名称: IEEE International Symposium on Circuits and Systems
会议日期: MAY 25-28,
出版日期: 2003
会议地点: BANGKOK, THAILAND
关键词: 2D stack generation ; analog VLSI design algorithm ; bi-axial symmetry ; block merging ; dummy transistor insertion ; mismatch minimization ; parasitic control ; symmetric Eulerian graph ; symmetric Eulerian trail ; VLSI ; analogue integrated circuits ; circuit CAD
出版者: PROCEEDINGS OF THE 2003 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL IV - DIGITAL SIGNAL PROCESSING-COMPUTER AIDED NETWORK DESIGN-ADVANCED TECHNOLOGY
出版地: 345 E 47TH ST, NEW YORK, NY 10017 USA
收录类别: istp ; ieee
ISBN: 0-7803-7761-3
部门归属: Chinese Acad Sci, Inst Software, Beijing 100080, Peoples R China.
主办者: IEEE Circuits & Syst Soc, Mahanakorn Univ Technol
英文摘要: In analog VLSI design, 2-axial symmetry stack and block merging are critical for mismatch minimization and parasitic control. In this paper, algorithms for analog VLSI 2-axial symmetry stack and block merging are described. We get several theo
语种: 英语
内容类型: 会议论文
URI标识: http://ir.iscas.ac.cn/handle/311060/13200
Appears in Collections:软件所图书馆_会议论文

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Recommended Citation:
Liu R,Dong SQ,Hong XL,et al. algorithms for analog vlsi 2d stack generation and block merging[C]. 见:IEEE International Symposium on Circuits and Systems. BANGKOK, THAILAND. MAY 25-28,.
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