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题名:
tuple density: a new metric for combinatorial test suites (nier track)
作者: Chen Baiqiang ; Zhang Jian
会议文集: Proceedings - International Conference on Software Engineering
会议名称: 33rd International Conference on Software Engineering, ICSE 2011
会议日期: 21-May-20
出版日期: 2011
会议地点: Waikiki, Honolulu, HI, United states
关键词: Software engineering ; Testing
出版地: United States
收录类别: EI
ISSN: 2705257
ISBN: 9781450304450
部门归属: (1) State Key Lab. of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing, 100190, China; (2) Graduate University, Chinese Academy of Sciences, China
主办者: Assoc. Comput. Mach., Spec. Interest Group Softw.; Eng. (ACM SIGSOFT); IEEE Computer Society; Technical Council on Software Engineering (TCSE)
英文摘要: We propose tuple density to be a new metric for combinatorial test suites. It can be used to distinguish one test suite from another even if they have the same size and strength. Moreover, it is also illustrated how a given test suite can be optimized based on this metric. The initial experimental results are encouraging. © 2011 ACM.
内容类型: 会议论文
URI标识: http://ir.iscas.ac.cn/handle/311060/14209
Appears in Collections:计算机科学国家重点实验室 _会议论文

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Recommended Citation:
Chen Baiqiang,Zhang Jian. tuple density: a new metric for combinatorial test suites (nier track)[C]. 见:33rd International Conference on Software Engineering, ICSE 2011. Waikiki, Honolulu, HI, United states. 21-May-20.
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