| Title: | characterizing failure-causing parameter interactions by adaptive testing |
| Author: | Zhang Zhiqiang
; Zhang Jian
|
| Source: | 2011 International Symposium on Software Testing and Analysis, ISSTA 2011 - Proceedings
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| Conference Name: | 20th International Symposium on Software Testing and Analysis, ISSTA 2011
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| Conference Date: | 17-Jul-02
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| Issued Date: | 2011
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| Conference Place: | Toronto, ON, Canada
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| Keyword: | Computer software selection and evaluation
; Fault detection
; Testing
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| Publish Place: | United States
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| Indexed Type: | EI
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| ISBN: | 9781450305624
|
| Department: | (1) State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, China; (2) Graduate University, Chinese Academy of Sciences, China
|
| Sponsorship: | Assoc. Comput. Mach., Spec. Interest Group; Softw. Eng. (ACM SIGSOFT)
|
| English Abstract: | Combinatorial testing is a widely used black-box testing technique, which is used to detect failures caused by parameter interactions (we call them faulty interactions). Traditional combinatorial testing techniques provide fault detection, but most of them provide weak fault diagnosis. In this paper, we propose a new fault characterization method called faulty interaction characterization (FIC) and its binary search alternative FIC-BS to locate one failure-causing interaction in a single failing test case. In addition, we provide a tradeoff strategy of locating multiple faulty interactions in one test case. Our methods are based on adaptive black-box testing, in which test cases are generated based on outcomes of previous tests. For locating a t-way faulty interaction, the number of test cases used is at most k (for FIC) or t(⌈log2 k⌉+1)+1 (for FIC-BS), where k is the number of parameters. Simulation experiments show that our method needs smaller number of adaptive test cases than most existing methods for locating randomly-generated faulty interactions. Yet it has stronger or equivalent ability of locating faulty interactions. © 2011 ACM. |
| Content Type: | 会议论文
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| URI: | http://ir.iscas.ac.cn/handle/311060/14251
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| Appears in Collections: | 计算机科学国家重点实验室 _会议论文
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| p331-zhang.pdf（409KB） | -- | -- | 限制开放 | -- | 联系获取全文 |
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| Recommended Citation: | |
Zhang Zhiqiang,Zhang Jian. characterizing failure-causing parameter interactions by adaptive testing[C]. 见:20th International Symposium on Software Testing and Analysis, ISSTA 2011. Toronto, ON, Canada. 17-Jul-02.
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