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Title:
Templates selection in non-overlapping template matching test
Author: Chen MeiHui(陈美会) ; Chen, H ; Fan, LM ; Feng, DG
Keyword: statistical testing ; cryptography ; string matching ; correlation theory ; m-bit templates ; correlation theorem ; correlation degree ; randomness statistical tests ; nonoverlapping template matching test ; templates selection
Source: ELECTRONICS LETTERS
Issued Date: 2016
Volume: 52, Issue:18, Pages:1533-1534
Indexed Type: SCI
Department: Chinese Acad Sci, Inst Software, Trusted Comp & Informat Assurance Lab, Beijing 100190, Peoples R China.
Abstract: It is important to study the correlation of randomness statistical tests The correlation of templates in non-overlapping template matching test is studied. The correlation degree between templates is defined and a correlation theorem is presented. For two different m-bit templates, when the last m-1 bits of one are equal to the first m-1 bits of the other one, correlation degree of them reaches the maximum value. Correlation experiments are also carried out and the results agree with the theorem. Finally, an effective selection strategy is proposed and the number of templates can be reduced about 50%.
English Abstract: It is important to study the correlation of randomness statistical tests The correlation of templates in non-overlapping template matching test is studied. The correlation degree between templates is defined and a correlation theorem is presented. For two different m-bit templates, when the last m-1 bits of one are equal to the first m-1 bits of the other one, correlation degree of them reaches the maximum value. Correlation experiments are also carried out and the results agree with the theorem. Finally, an effective selection strategy is proposed and the number of templates can be reduced about 50%.
Language: 英语
WOS ID: WOS:000383378500015
Citation statistics:
Content Type: 期刊论文
URI: http://ir.iscas.ac.cn/handle/311060/17300
Appears in Collections:软件所图书馆_期刊论文

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Recommended Citation:
Chen, MH,Chen, H,Fan, LM,et al. Templates selection in non-overlapping template matching test[J]. ELECTRONICS LETTERS,2016-01-01,52(18):1533-1534.
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