| 题名: | 考虑缺陷关联的软件可靠性增长模型研究 |
| 作者: | 张荣辉
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| 答辩日期: | 2007-06-05
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| 授予单位: | 中国科学院软件研究所
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| 授予地点: | 软件研究所
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| 学位: | 博士
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| 关键词: | 软件可靠性增长模型
; 非齐次泊松过程
; 软件缺陷关联
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| 其他题名: | Research on Software Reliability Growth Model Considering Defect Correlation
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| 摘要: | 软件可靠性已经成为软件产品最重要的质量特征之一。软件可靠性增长模型（SRGM）利用测试阶段得到的数据建模，对软件的可靠性和潜伏缺陷数进行估计。非齐次泊松过程类软件可靠性增长模型(NHPP-SRGMs)是软件可靠性增长模型中非常重要的一类，已经成为软件可靠性工程实践中非常重要的工具。大多数的软件可靠性增长模型都有缺陷之间相互独立的假设，而实际情况并非如此，缺陷之间存在着关联关系，而且在排除缺陷时有可能引入新的缺陷，从而使软件的缺陷数增加，影响软件可靠性增长模型的预测结果。
针对以上问题，本文以传统的NHPP-SRGMs的研究为基础，建立了一个考虑缺陷关联的NHPP类可靠性增长模型DC-SRGM(Defect Correlation SRGM)。具体工作包括：
首先，分析了软件测试过程中缺陷关联的现象，依据关联关系将缺陷分为固有缺陷和二次缺陷，进一步将固有缺陷分为独立缺陷和依赖缺陷，在此基础上给出了考虑缺陷关联的缺陷排除过程。
其次，在缺陷分类的基础上，依据各类缺陷的不同特点，建立了模型假设，依次对各类缺陷的失效分布进行求解，进而建立了考虑缺陷关联的DC-DRGM，并给出了模型的参数估计方法和评价标准。
最后，针对本组织三组实际项目失效数据应用了DC-SRGM，并与传统的NHPP类模型进行了对比研究，结果表明，DC-SRGM拥有相对较好的预测有效性、假设质量和实用性。 |
| 英文摘要: | The reliability of software products has become one of the most important attributes. Non-homogeneous poisson process software reliability growth models (NHPP-SRGMs) are quite successful tools which have been proposed to assess the reliability of software; however, most NHPP-SRGMs do not take the phenomena of defect correlation in the test process into account. In fact, the defects are not independent and the removal of a defect may inject a new defect.
To solve the above problem, based on the traditional NHPP-SRGMs, this paper promotes a new NHPP-SRGM called DC-SRGM (Defect Correlation SRGM) which considers the defect correlations. The contents include:
First, we analyze the phenomenon of defect correlations in the software testing process, and classify the defects; Second, we give the assumptions based on the classification and construct the DC-SRGM; Last, we use the DC-SRGM to estimate 3 groups of real failure data, and experimental result shows that the proposed model DC-SRGM fits the failure data quite well and has a fairly accurate prediction capability. |
| 语种: | 中文
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| 内容类型: | 学位论文
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| URI标识: | http://ir.iscas.ac.cn/handle/311060/6070
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| Appears in Collections: | 中科院软件所
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| File Name/ File Size |
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| 10001_200428015029047张荣辉_paper.doc（10360KB） | -- | -- | 限制开放 | -- | 联系获取全文 |
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| Recommended Citation: | |
张荣辉. 考虑缺陷关联的软件可靠性增长模型研究[D]. 软件研究所. 中国科学院软件研究所. 2007-06-05.
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