| Title: | a sentence generation algorithm for testing grammars |
| Author: | Zheng Lixiao
; Wu Duanyi
|
| Source: | Proceedings - International Computer Software and Applications Conference
|
| Conference Name: | IEEE 33rd International Computer Software and Applications Conference
|
| Conference Date: | JUL 20-24,
|
| Issued Date: | 2009
|
| Conference Place: | Seattle, WA
|
| Keyword: | by-now folklore sentence generation algorithm
; complicated derivation structure
; context-free grammar testing
; error location
; grammar debugging
; length control mechanism
; user validation
; context-free grammars
; program debugging
; program testing
; program verification
|
| Publisher: | 2009 IEEE 33RD INTERNATIONAL COMPUTER SOFTWARE AND APPLICATIONS CONFERENCE, VOLS 1 AND 2
|
| Publish Place: | 345 E 47TH ST, NEW YORK, NY 10017 USA
|
| Indexed Type: | istp,ieee,ei
|
| ISSN: | 0730-3157
|
| ISBN: | 978-1-4244-4525-7
|
| Department: | Zheng, Lixiao; Wu, Duanyi Chinese Acad Sci, Inst Software, State Key Lab Comp Sci, Beijing 100864, Peoples R China.
|
| Sponsorship: | IEEE
|
| English Abstract: | One simple approach to testing grammars is to derive a number of sentences from the grammar under test and to validate whether they comply with the intended language. Purdom has proposed a by-now folklore sentence generation algorithm which however suffers from the fact that the sentences generated are usually too few and some of them are long with complicated derivation structures. In this paper we present an improved algorithm which incorporates a length control mechanism into the generation process to produce more and simpler sentences. Experiments demonstrate that besides the benefits for user validation and error location, our algorithm is also helpful in highlighting more errors in some cases. |
| Language: | 英语
|
| Content Type: | 会议论文
|
| URI: | http://ir.iscas.ac.cn/handle/311060/8276
|
| Appears in Collections: | 中科院软件所图书馆_2009年期刊/会议论文
|
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| Recommended Citation: | |
Zheng Lixiao,Wu Duanyi. a sentence generation algorithm for testing grammars[C]. 见:IEEE 33rd International Computer Software and Applications Conference. Seattle, WA. JUL 20-24,.
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