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Title:
a dynamic model to handle defect-oriented processes
Author: Wu Shujian ; Li Mingshu ; Yang Ye
Conference Name: Conference on Systems Science, Management Science and System Dynamics
Conference Date: MAY 29-31,
Issued Date: 2009
Conference Place: Shanghai, PEOPLES R CHINA
Keyword: Software defect prediction ; Defect removal efficiency ; System Dynamics ; Defect introduction and removal process
Publisher: PROCEEDINGS OF 2009 CONFERENCE ON SYSTEMS SCIENCE, MANAGEMENT SCIENCE & SYSTEM DYNAMICS, VOL 7
Publish Place: PO BOX 173 WANSHOU ROAD, BEIJING 100036, PEOPLES R CHINA
Indexed Type: istp
ISBN: 978-7-121-09444-6
Department: Wu, Shujian; Li, Mingshu; Yang, Ye Chinese Acad Sci, Inst Software, Beijing 100864, Peoples R China.
Sponsorship: Tongji Univ, Inst Dev Study, Syst Engn Soc China, Comm Syst Dynam, Syst Dynam Soc, China Chapter, Shanghai Inst Foreign Trade, Syst Dynam Soc, Chapters Asia Pacific Area
English Abstract: Defect prediction and estimation techniques play an important role in the quantitative management. This paper proposes a defect-oriented model based on System Dynamics, incorporating the Defect Removal Efficiency model to improve the quantitative defect management. Using the dynamic model, we can simulate defect introduction and removal processes, and estimate the residual defect density in different phases of the software lifecycle. We provide the model initialization, and validate simulation results with the empirical and real project data. These experiments show that the model could access the variance of the actual situation.
Language: 英语
Content Type: 会议论文
URI: http://ir.iscas.ac.cn/handle/311060/8282
Appears in Collections:互联网软件技术实验室 _会议论文

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Recommended Citation:
Wu Shujian,Li Mingshu,Yang Ye. a dynamic model to handle defect-oriented processes[C]. 见:Conference on Systems Science, Management Science and System Dynamics. Shanghai, PEOPLES R CHINA. MAY 29-31,.
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