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Title:
demo abstract: nisat - a zero-side-effect testbed for wireless sensor networks
Author: Huangfu Wei ; Sun Limin ; Zhou Xinyun
Source: Proceedings of the 7th ACM Conference on Embedded Networked Sensor Systems, SenSys 2009
Conference Name: 7th ACM Conference on Embedded Networked Sensor Systems, SenSys 2009
Conference Date: 40851
Issued Date: 2009
Conference Place: Berkeley, CA, United states
Keyword: Embedded systems ; Sensor networks ; Test facilities ; Testbeds ; Testing ; Wireless telecommunication systems
Publish Place: United States
Indexed Type: EI
ISBN: 9781605587486
Department: (1) Institute of Software, Chinese Academy of Sciences, Beijing, China; (2) State Key Laboratory of Information Security, Beijing, China
Sponsorship: ACM SIGARCH; ACM SIGBED; ACM SIGCOMM; ACM SIGMETRICS; ACM SIGMOBILE; ACM SIGOPS
English Abstract: The NISAT testbed consists of a center server and many test units. The test units probe the internal interconnected signals inside the motes with extra hardware sniffers. The server gathers, parses and analyzes all data from test units to obtain the information on the network behavior. By adopting the passive sniffing mechanism, NISAT has no side effect on the normal behavior of sensor networks, and it is transparent to the software running on motes. NISAT offers accurate and precise test data for the studies on sensor networks, especially for the high-precision performance measurements and black-box tests without source codes.
Content Type: 会议论文
URI: http://ir.iscas.ac.cn/handle/311060/8466
Appears in Collections:基础软件国家工程研究中心_会议论文

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Recommended Citation:
Huangfu Wei,Sun Limin,Zhou Xinyun. demo abstract: nisat - a zero-side-effect testbed for wireless sensor networks[C]. 见:7th ACM Conference on Embedded Networked Sensor Systems, SenSys 2009. Berkeley, CA, United states. 40851.
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