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题名:
supporting flexible reification of design patterns
作者: Shen Wuwei ; Kim Dae-Kyoo ; Liu Jian ; Zhao Chen
会议文集: Proceedings - Asia-Pacific Software Engineering Conference, APSEC
会议名称: 17th Asia Pacific Software Engineering Conference: Software for Improving Quality of Life, APSEC 2010
会议日期: 40850
出版日期: 2010
会议地点: Sydney, NSW, Australia
关键词: Computer software ; Model checking
出版地: United States
收录类别: EI
ISSN: 15301362
ISBN: 9780770000000
部门归属: (1) Department of Computer Science, Western Michigan University, Kalamazoo, MI 49008, United States; (2) Department of Computer Science and Engineering, Oakland University, Rochester, MI 48309, United States; (3) Institute of Software, Chinese Academy of Sciences, Beijing 100190, China
英文摘要: Design patterns have been widely accepted as a solution for solving recurring design problems in object-oriented development. Reifications of design patterns can vary from one development environment to another, and use of inappropriate reifications may impose a serious threat to quality of a software system. In this paper, we propose an approach to applying the profile mechanism in reifying a design pattern. Central to this approach are stereotypes that are defined in a profile and used to represent different roles in a design pattern. Developers can apply these stereotypes in their application model when design patterns are used. The advantage of the profile mechanism is that developers can 1) define their own reification of a pattern in a profile based on a specific software system, and 2) find errors in an application model via the conformance checking of the model against the profile. More importantly, we apply our existing tool called ICER, which is based on the profile mechanism, to provide automatic checking for the application of design patterns. To illustrate the advantage of the profile mechanism supported by ICER, we show the different reifications for the Observer pattern. Last, experimental results show that ICER does not suffer from the scalability problem as the size of an application model increases. © 2010 IEEE.
内容类型: 会议论文
URI标识: http://ir.iscas.ac.cn/handle/311060/8924
Appears in Collections:基础软件国家工程研究中心_会议论文

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Recommended Citation:
Shen Wuwei,Kim Dae-Kyoo,Liu Jian,et al. supporting flexible reification of design patterns[C]. 见:17th Asia Pacific Software Engineering Conference: Software for Improving Quality of Life, APSEC 2010. Sydney, NSW, Australia. 40850.
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