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Dynamically Discovering Likely Memory Layout to Perform Accurate Fuzzing [期刊论文]
IEEE TRANSACTIONS ON RELIABILITY, 2016-01-01, 卷号: 65, 期号: 3, 页码: 1180-1194
Chen, K; Zhang, YJ; Liu, P
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black-box testing based on colorful taint analysis [期刊论文]
SCIENCE CHINA-INFORMATION SCIENCES, 2012-01-01, 卷号: 55, 期号: 1, 页码: 171-183
Chen Kai; Feng DengGuo; Su PuRui; Zhang YingJun

 

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