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| on statistical properties of s-boxes in block ciphers | |
| Hua C; Wu CK; Feng DG | |
| 2005 | |
| Source | CHINESE JOURNAL OF ELECTRONICS
 |
| ISSN | 1022-4653 |
| Volume | 14Issue:4Pages:584-587 |
| Indexed Type | sci ; ei |
| Keyword | Block Cipher S-box Bias Test |
| Department | Chinese Acad Sci, Inst Software, State Key Lab Informat Secur, Beijing 100080, Peoples R China. |
| Subject | Engineering, Electrical & Electronic |
| Language | 英语 |
| WOS ID | WOS:000237133300006 |
| Citation statistics | |
| Content Type | 期刊论文 |
| URI | http://ir.iscas.ac.cn/handle/311060/12464 |
| Collection | 中国科学院软件研究所 |
| Recommended Citation GB/T 7714 | Hua C,Wu CK,Feng DG. on statistical properties of s-boxes in block ciphers[J]. CHINESE JOURNAL OF ELECTRONICS,2005,14(4):584-587. |
| APA | Hua C,Wu CK,&Feng DG.(2005).on statistical properties of s-boxes in block ciphers.CHINESE JOURNAL OF ELECTRONICS,14(4),584-587. |
| MLA | Hua C,et al."on statistical properties of s-boxes in block ciphers".CHINESE JOURNAL OF ELECTRONICS 14.4(2005):584-587. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| On Statistical Prope（207KB） | 开放获取 | -- | Application Full Text | |||
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