on statistical properties of s-boxes in block ciphers

ISCAS OpenIR

	on statistical properties of s-boxes in block ciphers
	Hua C; Wu CK; Feng DG
	2005
发表期刊	CHINESE JOURNAL OF ELECTRONICS
ISSN	1022-4653
卷号	14 期号:4 页码:584-587
收录类别	sci ; ei
关键词	Block Cipher S-box Bias Test
部门归属	Chinese Acad Sci, Inst Software, State Key Lab Informat Secur, Beijing 100080, Peoples R China.
学科领域	Engineering, Electrical & Electronic
语种	英语
WOS记录号	WOS:000237133300006
引用统计
内容类型	期刊论文
URI标识	http://ir.iscas.ac.cn/handle/311060/12464
专题	中国科学院软件研究所
推荐引用方式 GB/T 7714	Hua C,Wu CK,Feng DG. on statistical properties of s-boxes in block ciphers[J]. CHINESE JOURNAL OF ELECTRONICS,2005,14(4):584-587.
APA	Hua C,Wu CK,&Feng DG.(2005).on statistical properties of s-boxes in block ciphers.CHINESE JOURNAL OF ELECTRONICS,14(4),584-587.
MLA	Hua C,et al."on statistical properties of s-boxes in block ciphers".CHINESE JOURNAL OF ELECTRONICS 14.4(2005):584-587.