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characterizing failure-causing parameter interactions by adaptive testing
Zhang Zhiqiang; Zhang Jian
2011
会议名称20th International Symposium on Software Testing and Analysis, ISSTA 2011
会议录名称2011 International Symposium on Software Testing and Analysis, ISSTA 2011 - Proceedings
页码331-341
会议日期17-Jul-02
会议地点Toronto, ON, Canada
收录类别EI
出版地United States
ISBN9781450305624
部门归属(1) State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, China; (2) Graduate University, Chinese Academy of Sciences, China
摘要Combinatorial testing is a widely used black-box testing technique, which is used to detect failures caused by parameter interactions (we call them faulty interactions). Traditional combinatorial testing techniques provide fault detection, but most of them provide weak fault diagnosis. In this paper, we propose a new fault characterization method called faulty interaction characterization (FIC) and its binary search alternative FIC-BS to locate one failure-causing interaction in a single failing test case. In addition, we provide a tradeoff strategy of locating multiple faulty interactions in one test case. Our methods are based on adaptive black-box testing, in which test cases are generated based on outcomes of previous tests. For locating a t-way faulty interaction, the number of test cases used is at most k (for FIC) or t(⌈log2 k⌉+1)+1 (for FIC-BS), where k is the number of parameters. Simulation experiments show that our method needs smaller number of adaptive test cases than most existing methods for locating randomly-generated faulty interactions. Yet it has stronger or equivalent ability of locating faulty interactions. © 2011 ACM.
关键词Computer Software Selection And Evaluation Fault Detection Testing
主办者Assoc. Comput. Mach., Spec. Interest Group; Softw. Eng. (ACM SIGSOFT)
内容类型会议论文
URI标识http://ir.iscas.ac.cn/handle/311060/14251
专题基础软件与系统重点实验室
推荐引用方式
GB/T 7714
Zhang Zhiqiang,Zhang Jian. characterizing failure-causing parameter interactions by adaptive testing[C]. United States,2011:331-341.
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