Institutional Repository
| Corrected runs distribution test for pseudorandom number generators | |
Fan, LM; Chen, H; Chen, MH ; Gao, S
| |
| 2016 | |
| Source | ELECTRONICS LETTERS
 |
| ISSN | 0013-5194 |
| Volume | 52Issue:4Pages:281-282 |
| English Abstract | Runs distribution test is an important statistical test based on Golomb's randomness postulates. It is an important randomness test included in some famous evaluation standards and statistical test suites such as Application Notes and Interpretation of the Scheme (AIS20), the Federal Information Processing Standards (FIPS140), CryptX, and so on. However, when it is applied on some well-known good Deterministic Random Bit Generators (DRBGs), the test results show apparent bias from randomness. This shows that there exist some inaccuracies in the runs distribution test. The problem is solved and the runs distribution test through two ways is corrected. First, the degree of freedom of statistical value V is adjusted. Secondly, the expected number of different lengths runs is modified. The experiment results show that the corrected runs distribution test is more accurate under two-level evaluation approach proposed by National Institute of Standards and Technology (NIST) Special Publication (SP) 800-22.; Runs distribution test is an important statistical test based on Golomb's randomness postulates. It is an important randomness test included in some famous evaluation standards and statistical test suites such as Application Notes and Interpretation of the Scheme (AIS20), the Federal Information Processing Standards (FIPS140), CryptX, and so on. However, when it is applied on some well-known good Deterministic Random Bit Generators (DRBGs), the test results show apparent bias from randomness. This shows that there exist some inaccuracies in the runs distribution test. The problem is solved and the runs distribution test through two ways is corrected. First, the degree of freedom of statistical value V is adjusted. Secondly, the expected number of different lengths runs is modified. The experiment results show that the corrected runs distribution test is more accurate under two-level evaluation approach proposed by National Institute of Standards and Technology (NIST) Special Publication (SP) 800-22. |
| Indexed Type | SCI |
| Keyword | Random Number Generation Statistical Analysis Pseudorandom Number Generators Corrected Runs Distribution Test Golomb Randomness Postulates Statistical Test Suites Ais20 Fips140 Cryptx Drbg Two-level Evaluation Approach Nist Sp 800-22 |
| Department | Chinese Acad Sci, Inst Software, Trusted Comp & Informat Assurance Lab, Beijing 100190, Peoples R China. |
| Language | 英语 |
| WOS ID | WOS:000369863000016 |
| Citation statistics | |
| Content Type | 期刊论文 |
| URI | http://ir.iscas.ac.cn/handle/311060/17349 |
| Collection | 中国科学院软件研究所 |
| Recommended Citation GB/T 7714 | Fan, LM,Chen, H,Chen, MH,et al. Corrected runs distribution test for pseudorandom number generators[J]. ELECTRONICS LETTERS,2016,52(4):281-282. |
| APA | Fan, LM,Chen, H,Chen, MH,&Gao, S.(2016).Corrected runs distribution test for pseudorandom number generators.ELECTRONICS LETTERS,52(4),281-282. |
| MLA | Fan, LM,et al."Corrected runs distribution test for pseudorandom number generators".ELECTRONICS LETTERS 52.4(2016):281-282. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 07405392.pdf（79KB） | 开放获取 | License | Application Full Text | |||
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