Corrected runs distribution test for pseudorandom number generators

ISCAS OpenIR

	Corrected runs distribution test for pseudorandom number generators
	Fan, LM; Chen, H; Chen, MH; Gao, S
	2016
发表期刊	ELECTRONICS LETTERS
ISSN	0013-5194
卷号	52 期号:4 页码:281-282
摘要	Runs distribution test is an important statistical test based on Golomb's randomness postulates. It is an important randomness test included in some famous evaluation standards and statistical test suites such as Application Notes and Interpretation of the Scheme (AIS20), the Federal Information Processing Standards (FIPS140), CryptX, and so on. However, when it is applied on some well-known good Deterministic Random Bit Generators (DRBGs), the test results show apparent bias from randomness. This shows that there exist some inaccuracies in the runs distribution test. The problem is solved and the runs distribution test through two ways is corrected. First, the degree of freedom of statistical value V is adjusted. Secondly, the expected number of different lengths runs is modified. The experiment results show that the corrected runs distribution test is more accurate under two-level evaluation approach proposed by National Institute of Standards and Technology (NIST) Special Publication (SP) 800-22.; Runs distribution test is an important statistical test based on Golomb's randomness postulates. It is an important randomness test included in some famous evaluation standards and statistical test suites such as Application Notes and Interpretation of the Scheme (AIS20), the Federal Information Processing Standards (FIPS140), CryptX, and so on. However, when it is applied on some well-known good Deterministic Random Bit Generators (DRBGs), the test results show apparent bias from randomness. This shows that there exist some inaccuracies in the runs distribution test. The problem is solved and the runs distribution test through two ways is corrected. First, the degree of freedom of statistical value V is adjusted. Secondly, the expected number of different lengths runs is modified. The experiment results show that the corrected runs distribution test is more accurate under two-level evaluation approach proposed by National Institute of Standards and Technology (NIST) Special Publication (SP) 800-22.
收录类别	SCI
关键词	Random Number Generation Statistical Analysis Pseudorandom Number Generators Corrected Runs Distribution Test Golomb Randomness Postulates Statistical Test Suites Ais20 Fips140 Cryptx Drbg Two-level Evaluation Approach Nist Sp 800-22
部门归属	Chinese Acad Sci, Inst Software, Trusted Comp & Informat Assurance Lab, Beijing 100190, Peoples R China.
语种	英语
WOS记录号	WOS:000369863000016
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
内容类型	期刊论文
URI标识	http://ir.iscas.ac.cn/handle/311060/17349
专题	中国科学院软件研究所
推荐引用方式 GB/T 7714	Fan, LM,Chen, H,Chen, MH,et al. Corrected runs distribution test for pseudorandom number generators[J]. ELECTRONICS LETTERS,2016,52(4):281-282.
APA	Fan, LM,Chen, H,Chen, MH,&Gao, S.(2016).Corrected runs distribution test for pseudorandom number generators.ELECTRONICS LETTERS,52(4),281-282.
MLA	Fan, LM,et al."Corrected runs distribution test for pseudorandom number generators".ELECTRONICS LETTERS 52.4(2016):281-282.

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