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automated test program generation for an industrial optimizing compiler
Zhao Chen; Xue Yunzhi; Tao Qiuming; Guo Liang; Wang Zhaohui
2009
会议名称4th International Workshop on Automation of Software Test (AST 2009) held at the 31st International Conference on Software Engineering
会议录名称Proceedings of the 2009 ICSE Workshop on Automation of Software Test, AST 2009
会议日期MAY 18-19,
会议地点Vancouver, CANADA
出版地345 E 47TH ST, NEW YORK, NY 10017 USA
出版者2009 ICSE WORKSHOP ON AUTOMATION OF SOFTWARE TEST
ISBN978-1-4244-3711-5
部门归属Zhao, Chen; Xue, Yunzhi; Tao, Qiuming; Guo, Liang; Wang, Zhaohui Chinese Acad Sci, Inst Software, Beijing, Peoples R China.
摘要This paper presents joint research and practice on automated test program generation for an industrial compiler, UniPhier, by Matsushita Electric Industrial Co., Ltd. (MEI) and Institute of Software, Chinese Academy of Sciences (ISCAS) since Sept. 2002. To meet the test requirements of MEIs engineers, we proposed an automated approach to produce test programs for UniPhier, and as a result we developed an integrated tool named JTT. Firstly, we show the script-driven test program generation process in JTT. Secondly, we show how to produce test programs automatically, based on a temporal-logic model of compiler optimizations, to guarantee the execution of optimizing modules under test during compilation. JTT has gained success in testing UniPhier: even after benchmark testing and comprehensive manual testing, JTT still found 6 new serious defects.
关键词Chinese Academy Of Sciences Institute Of sOftware Matsushita Electric Industrial Co., Ltd Automated Test Program Generation Industrial Optimizing Compiler Script-driven Test Program Generation Process Temporal-logic Model Automatic Programming Optimising Compilers Program Testing Temporal Logic
主办者Association for Computing Machinery, ACM; IEEE; IEEE Computer Society; SIGSOFT
内容类型会议论文
URI标识http://ir.iscas.ac.cn/handle/311060/8332
专题基础软件国家工程研究中心
推荐引用方式
GB/T 7714
Zhao Chen,Xue Yunzhi,Tao Qiuming,et al. automated test program generation for an industrial optimizing compiler[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:2009 ICSE WORKSHOP ON AUTOMATION OF SOFTWARE TEST,2009.
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