static analysis of a class of memory leaks in trustedbsd mac framework

	static analysis of a class of memory leaks in trustedbsd mac framework
	Wu Xinsong; Zhou Zhouyi; He Yeping; Liang Hongliang
	2009
Conference Name	5th International Conference on Information Security Practice and Experience
Source	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Conference Date	APR 13-15,
Conference Place	Xi an, PEOPLES R CHINA
Publish Place	HEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY
Publisher	INFORMATION SECURITY PRACTICE AND EXPERIENCE, PROCEEDINGS - 5TH INTERNATIONAL CONFERENCE, ISPEC 2009
ISSN	0302-9743
ISBN	978-3-642-00842-9
Department	Wu, Xinsong; Zhou, Zhouyi; He, Yeping; Liang, Hongliang Chinese Acad Sci, Inst Software, Beijing, Peoples R China.
English Abstract	Security labels of subjects and objects are crucial for some security policies and are an essential part of the TrustedBSD MAC framework. We find that security labels not being destroyed properly will result in memory leaks. This paper analyzes the security labels management of the TrustedBSD MAC framework and presents a path-sensitive static analysis approach to detect potential memory leaks caused by the security label management. This approach verifies complete destruction of security labels through compiler-integrated checking rules at compile-time. It achieves complete coverage of execution paths and has low false positive rate.
Keyword	Static Analysis Memory Leak Trustedbsd Mac Framework Security Label Mygcc
Sponsorship	Xidian Univ, Xidian Univ, Sch Telecommun Engn, Key Lab Comp Networks & Informat Security, Minist Educ
Content Type	会议论文
URI	http://ir.iscas.ac.cn/handle/311060/8382
Collection	基础软件国家工程研究中心
Recommended Citation GB/T 7714	Wu Xinsong,Zhou Zhouyi,He Yeping,et al. static analysis of a class of memory leaks in trustedbsd mac framework[C]. HEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY:INFORMATION SECURITY PRACTICE AND EXPERIENCE, PROCEEDINGS - 5TH INTERNATIONAL CONFERENCE, ISPEC 2009,2009.

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