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effect of staffing pattern on software project: an empirical analysis
Dong Fei; Li Mingshu; Li Juan; Yang Ye; Wang Qing
2009
Conference Name3rd International Symposium on Empirical Software Engineering and Measurement
Source2009 3rd International Symposium on Empirical Software Engineering and Measurement, ESEM 2009
Pages23-33
Conference DateOCT 15-16,
Conference PlaceLake Buena Vista, FL
Indexed Type其他
Publish Place345 E 47TH ST, NEW YORK, NY 10017 USA
PublisherESEM: 2009 3RD INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT
ISSN1938-6451
ISBN978-1-4244-4842-5
DepartmentDong, Fei; Li, Mingshu; Li, Juan; Yang, Ye; Wang, Qing Chinese Acad Sci, Inst Software, Beijing 100864, Peoples R China.
English AbstractResource allocation in software development is important and many methods have been proposed. Related empirical research is yet scarce and evidence is required to validate the theoretical methods. This paper introduces the staffing pattern as a metric of resource distribution among project phases, and verifies its effect on software quality and productivity using real project data. The main findings are: (1) there exist different staffing patterns in reality; (2) the staffing pattern has significant effect on software quality (post-release defect density); (3) the staffing pattern has no significant effect on productivity; (4) the effort invested on test, document or code inspection possibly explains the effect of staffing pattern on software quality; (5) the effort consumed by rework perhaps counteracts the effect of other potential factors on productivity. Preliminary heuristics are suggested to resource allocation practices.
KeywordCode Inspection
SponsorshipUniv SE Calif, Ctr Syst & Software Engn, ABB, Microsoft Res, IEEE, ACMSIGSOFT, N Carolina State Univ Comp Sci
Language英语
Content Type会议论文
URIhttp://ir.iscas.ac.cn/handle/311060/8262
Collection互联网软件技术实验室
Recommended Citation
GB/T 7714
Dong Fei,Li Mingshu,Li Juan,et al. effect of staffing pattern on software project: an empirical analysis[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:ESEM: 2009 3RD INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT,2009:23-33.
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