| effect of staffing pattern on software project: an empirical analysis | |
| Dong Fei; Li Mingshu; Li Juan; Yang Ye; Wang Qing | |
| 2009 | |
| 会议名称 | 3rd International Symposium on Empirical Software Engineering and Measurement |
| 会议录名称 | 2009 3rd International Symposium on Empirical Software Engineering and Measurement, ESEM 2009 |
| 页码 | 23-33 |
| 会议日期 | OCT 15-16, |
| 会议地点 | Lake Buena Vista, FL |
| 收录类别 | 其他 |
| 出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA |
| 出版者 | ESEM: 2009 3RD INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT |
| ISSN | 1938-6451 |
| ISBN | 978-1-4244-4842-5 |
| 部门归属 | Dong, Fei; Li, Mingshu; Li, Juan; Yang, Ye; Wang, Qing Chinese Acad Sci, Inst Software, Beijing 100864, Peoples R China. |
| 摘要 | Resource allocation in software development is important and many methods have been proposed. Related empirical research is yet scarce and evidence is required to validate the theoretical methods. This paper introduces the staffing pattern as a metric of resource distribution among project phases, and verifies its effect on software quality and productivity using real project data. The main findings are: (1) there exist different staffing patterns in reality; (2) the staffing pattern has significant effect on software quality (post-release defect density); (3) the staffing pattern has no significant effect on productivity; (4) the effort invested on test, document or code inspection possibly explains the effect of staffing pattern on software quality; (5) the effort consumed by rework perhaps counteracts the effect of other potential factors on productivity. Preliminary heuristics are suggested to resource allocation practices. |
| 关键词 | Code Inspection |
| 主办者 | Univ SE Calif, Ctr Syst & Software Engn, ABB, Microsoft Res, IEEE, ACMSIGSOFT, N Carolina State Univ Comp Sci |
| 语种 | 英语 |
| 内容类型 | 会议论文 |
| URI标识 | http://ir.iscas.ac.cn/handle/311060/8262 |
| 专题 | 互联网软件技术实验室 |
| 推荐引用方式 GB/T 7714 | Dong Fei,Li Mingshu,Li Juan,et al. effect of staffing pattern on software project: an empirical analysis[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:ESEM: 2009 3RD INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT,2009:23-33. |
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| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| 2009-董斐-ESEM.pdf（580KB） | 开放获取 | -- | 请求全文 | |||
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